MIEUX specializes in customizing integrated test socket solution to meet your evolving testing demands. Our precision fabrications are maintained at the highest quality.
Pogo pin test sockets can feature a high-density array of pins, allowing for simultaneous testing of multiple points on the DUT. There is a wide selection of pogo pins tailored to high-speed and high-temperature applications while ensuring reliability, signal integrity, and durability.
Cantilever probes are thin, flexible metal strips that bend to contact the DUT's test points. They are excellence for high current throughput yet with extremely high durability
Elastomeric sockets provide low inductance and high-frequency suitable for RF testing, as they minimize signal loss. The conductive elastomer rubber array ensures uniform pressure and signal integrity across all pads. quick to mount, easy to replace, and reusable. Perfect for R&D debugging, failure analysis and low volume production test.
Pogo pins can be customized to meet the specific requirements of a particular application. Customization options may include different plunger shapes, spring forces, and contact materials to optimize performance and reliability.
DLC coating (Diamond Like Carbon)
DLC coatings are highly wear-resistant and provide protection against solder migration, which significantly extends the lifespan of spring probes.
Every lid is engineered to your exact requirements. Choosing from liquid cooling for high power chips, integrated fans for active air cooling, or passive designs for lower power devices. Your chip, your thermal needs, your lid.
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Office Location
Singapore Office
26 Pioneer Cres, #02-10 West Park BizCentral, Singapore 628558
Tel: +65-64844321
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